Description:This is because of difference in the Feature-Row setting.
Solution:
While doing the test with different settings, the user would may be have programmed the Feature-Row with Setting-A (say, SPI_PORT=Enable, PROGRAMN=Disable),and with the same Setting-A JED file, the user would have programmed the Flash using the option "I2C Erase, Program, Verify".
Since, the Feature-Row setting on the Device and in the JED file matched, it would have passed once. But, when the user regenerated the JED file with another Setting, say Setting-B (SPI_PORT= Disable, PROGRAMN=Enable), and again tried programming the flashusing "I2C Erase, Program, Verify" it failed because the Feature-Row on device had Setting-A, and the Feature-Row on the new JED file had Setting-B,
and hence failed due to Feature-Row mismatch.Instead of "I2C Erase, Program, Verify" operation, had you used "I2C Erase, Program, Verify, Feature" operation it would have passed.