Description: On the ILF (Lattice lot ID) we only use the 2nd to 4th characters of the lot ID. The first character of the date code is the current decade (e.g. 1 on 1712), it was process on 2017, WW12. Another example is for the current Date code that ...
Lattice device material content and related RoHS information is available at: https://www.latticesemi.com/Support/QualityAndReliability https://www.latticesemi.com/en/Support/QualityAndReliability/DeviceMaterialContent.aspx
FIT rate for Lattice device in included in Reliability report which consists of other test result. https://www.latticesemi.com/Support/QualityAndReliability Failure rates in this reliability report are expressed in FITS. Due to the very low failure ...
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The Reliability report for the MachXO2 Product Family has data on Soft Error Rate (SER) testing. SER testing is conducted to characterize the sensitivity of SRAM storage and device logic elements to High Energy Neutron and Alpha Particle radiation. ...