918 - What is the FIT rate for Lattice device?

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  SER is provided for the sensitivity of EECPLD storage and device registered logic elements to High Energy Neutron and Alpha Particle radiation as per JEDEC JESD-89. Stress / Structure REGISTERED LOGIC EECLPD Neutron 0.6 0 Alpha N/A 0 SER is measured ...

• 922 - What is the composition of Lattice device pin?

  Lattice device material content and related RoHS information is available at: https://www.latticesemi.com/Support/QualityAndReliability https://www.latticesemi.com/en/Support/QualityAndReliability/DeviceMaterialContent.aspx

• 660 - Where can I find the Mean time between failures (MTBF) for a device?

  Mean time between failures (MTBF) is the predicted elapsed time between inherent failures of a system during operation. Due to the very low failure rate of integrated circuits, it is convenient to refer to failures in a population during a period of ...

• 1969 - MachXO2: Does Lattice provide any test data for MachXO2 device subjected to atmospheric neutrons ?

  The Reliability report for the MachXO2 Product Family has data on Soft Error Rate (SER) testing. SER testing is conducted to characterize the sensitivity of SRAM storage and device logic elements to High Energy Neutron and Alpha Particle radiation. ...

• 582 - How can I determine if I have an authentic Lattice device?

  To ensure you receive authentic Lattice device always purchase through one of our Lattice Sales office or approved distributors. To find the office closest to you check out: Lattice Sales Office