SER is provided for the sensitivity of EECPLD storage and device registered logic elements to High Energy Neutron and Alpha Particle radiation as per JEDEC JESD-89.
Stress / Structure REGISTERED LOGIC EECLPD
Neutron 0.6 0
Alpha N/A 0
SER is measured in FITs/Mb.
For more information about Soft Error Rate (SER) for ispMACH4000 devices, refer to Lattice ispMACH4000 V/B/C/ZC/ZE Product Family Qualification Summary.