3495 - MachXO2

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• 1969 - MachXO2: Does Lattice provide any test data for MachXO2 device subjected to atmospheric neutrons ?

  The Reliability report for the MachXO2 Product Family has data on Soft Error Rate (SER) testing. SER testing is conducted to characterize the sensitivity of SRAM storage and device logic elements to High Energy Neutron and Alpha Particle radiation. ...

• 364 - What does it mean when I have a part that is "dual-marked"?

  The part number stamped on the top of some Lattice semiconductor parts is different from the part number listed in the data sheet. In fact, the one stamped on the part looks like a combination of 2 part numbers in the data sheet. Lattice defines such ...